Topics
Low-Energy Inverse Photoemission Spectroscopy (LEIPS)
Analysis Examples Measurement of occupied and unoccupied states of the same sample The overall picture of the band structure can be obtained from the energy of the unoccupied states measured by LEIP
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Expanded application range with dual-source laboratory-type HAXPES
HAXPES, like XPS, enables highly reliable spectrum acquisition, expanding the possibilities of surface analysis. The detection depth and range of orbital selection have been broadened, and the applica
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Expanded application range with dual X-ray and dual ion gun
The automated laboratory-type HAXPES instrument "PHI Quantes" can now be equipped with a built-in Ar monomer/GCIB dual ion gun. By combining dual X-ray sources of soft X-ray and hard X-ray with a dua
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AES Survey Imaging
In survey imaging, wide spectra are measured at every image pixel. After measurement, wide spectra can be extracted from regions with different image contrast, enabling easy qualitative and quanti
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Reflection Electron Energy Loss Spectroscopy (REELS)
Analysis Examples Band gap measurement by REELS *This is a REELS spectrum of a thermally oxidized SiO₂ film (25 nm) on a Si wafer. A peak onset is observed at an energy 8.8 eV lower than the inciden
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PHI Quantes equipped with scanning dual monochromatic X-ray source
Scanning dual monochromatic X-ray source The operating principle diagram of the scanning dual X-ray source is shown. Hard X-ray (Cr Kα) and soft X-ray (Al Kα) can be switched in a short time via soft
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