What is the parallel imaging MS/MS option

By equipping TOF-SIMS with the parallel imaging MS/MS option, tandem mass spectrometry of the outermost surface can be achieved with high speed and high sensitivity, enabling simultaneous high-speed measurement of MS¹ and MS2 under static conditions.^*

（＊US Patent　EP,JP Patent Pending）

Simultaneous acquisition of MS¹ and MS² spectra and images

By extracting and branching a portion of the secondary ions obtained during MS¹ data measurement using a precursor selector, MS¹ and MS² data can be obtained in parallel and at high speed.

In MS1, all components present on the sample surface are detected, resulting in complex spectra. MS² data obtained by extraction and branching via the precursor selector yields simpler spectral patterns, enabling imaging of specific molecular structures.

Measurement examples of unknown organic materials

We introduce a measurement example of an unknown organic material. In the MS¹ spectrum, all components present on the sample surface are detected, resulting in complex spectra. In contrast, the MS² spectrum obtained by extraction and branching via the precursor selector yields a simpler spectral pattern, enabling more detailed chemical structure analysis.

Measurement example of unknown additives on polypropylene

This is an example of measuring unknown additives on polypropylene. Additives present only on the surface can be analyzed with high sensitivity, and the distribution of specific chemical structures can be visualized. (Click to enlarge the image)

Note: In this text, MS1 and MS2 refer to the hardware (detectors), while MS¹ and MS^{2 (with superscript numbers)} are used to indicate TOF-SIMS data, respectively.

Related Instruments Links

Time-of-Flight Secondary Ion Mass Spectrometer TOF-SIMS