Techniques

Techniques of Surface Analysis

Topics

The PHI Quantes Equipped with Dual Scanning Monochromatic X-ray Source

2017.08.28

The PHI Quantes Equipped with Dual Scanning Monochromatic X-ray Source

The PHI Quantes is equipped with a dual scanning X-ray source composed of a hard X-ray source (Cr Kα) and a conventional soft X-…

What is Parallel Imaging MS/MS Option ?

2017.07.27

What is Parallel Imaging MS/MS Option ?

The parallel imaging MS/MS option available for TOF-SIMS achieves high-speed and high- sensitive tandem mass spectrometry of the…

What is Hard X-ray Photoelectron Spectroscopy?

2015.09.02

What is Hard X-ray Photoelectron Spectroscopy?

The basic principle of hard x-ray photoelectron spectroscopy is similar to that of general XPS, which irradiates excitation ligh…

About TRIFT™ analyzers

2015.03.31

About TRIFT™ analyzers

The triple focusing electrostatic analyzer (TRIFT analyzer) simultaneously corrects the time-of-flight difference which occurs d…

About Gas Cluster Ion Beams

2014.08.15

About Gas Cluster Ion Beams

The Gas Cluster Ion Beam (GCIB) technology is an advanced technology from Japan, developed at Kyoto University. GCIB is an ion b…