Products

X-ray Photoelectron Spectroscopy / XPS

PHI QuantesNEW

PHI Quantes

Pioneer into a new area with an XPS equipped with both hard X-ray & conventional soft X-ray source.

PHI X-tool

This high performance scanning XPS instrument comes with a low price yet makes measurements for all types of applications and features easy, intuitive operation.

Auger Electron Spectroscopy / AES, SAM

PHI 710

The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.

 
 
 
 

Time-of-Flight SIMS / TOF-SIMS

PHI nanoTOF II™

This new TOF-SIMS instrument has the added flexibility needed to support diversified analysis application and also provides automated measurement from sample loading through to measurement.

 

Dynamic SIMS / D-SIMS

Other Services

Refurbished Equipment