PHI Quantes

X-ray Photoelectron Spectroscopy / XPS

PHI Quantes NEW

X-ray Photoelectron Spectroscopy / XPS PHI Quantes

The PHI Quantes is equipped with a dual scanning X-ray source composed of a hard X-ray source (Cr Kα) and a conventional soft X-ray source (Al Kα), which have different energy values. This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. The two different types of X-ray sources can be switched automatically, allowing users to analyze the same area and/or points of a sample. The PHI Quantes inherits the core technologies of the PHI Quantera II, which ensure the availability of the superior features such as automatic analysis, automatic sample transfer, turnkey charge neutralization, and advanced data processing. The PHI Quantes is an XPS instrument designed to pioneer new methods and applications transcending conventional ideas of what is possible.


Dual Scanning X-ray Photoelectron Microprobe Equipped with Hard X-Ray

Dual Scanning Monochromatic X-ray Source

Equipped with a dual scanning X-ray source composed of the monochromatic Cr Kα (5.4 keV) and Al Kα (1.5 keV), the PHI Quantes is capable of obtaining secondary electron images (SXI) by scanning X-ray beam over the sample, which precisely allows to identify areas and/or points where you want to analyze. Enhanced SmartSoft-XPS can control the X-ray anode position and the motorized mechanical shutter, which allows rapid switching between the Cr Kα and the Al Kα. The switchover requires no adjustments, making it easy to measure the same areas or points with both the Cr Kα and the Al Kα.

Dual Beam Source for Easy Measurement of the Same Spot

Software control of the X-ray anode allows rapid switching between the Cr Kα and the Al Kα. The switchover requires no adjustments, making it easy to measure the same spot with both the Cr Kα and the Al Kα.

Schematic diagram of dual scanning X-ray

Schematic Diagram of Dual Scanning X-ray

SXI with Dual Beam

SXI Images with Dual Beam

Turnkey Charge Neutralization

The patented turnkey charge neutralization that allows automatic charge compensation of the charged sample surface is also available on the PHI Quantes, as well as our other PHI XPS series, even when using Cr Kα.

> Description of Turnkey Charge Neutralization (to PHI Quantera II)

Scematic diagram of Turnkey Charge Neutralization

Schematic Diagram of Turnkey Charge Neutralization

F1s and C1s spectra of PTFE measured using the Cr Kα

F 1s and C 1s Spectra of PTFE Measured using the Cr Kα

Automatic Analysis Mode

Fully-automated analysis routine can be easily programed even if it takes days. The two standard parking positions in the analysis chamber enables fully-automated measurement of all samples, maximum of three, set on the PHI Quantes. In addition, the state-of-the-art turnkey charge neutralization technique also allows fully-automated analysis on insulating samples.

> Description of Navigation and Automatic Analysis (to PHI Quantera II)

Automatic analysis Mode

Proven High Voltage Analyzer

The proven high voltage analyzer, together with the newly-developed high transmission input lens, on the PHI Quantes enables superior sensitivity even when using Cr Kα. High voltage proof 32-channel multi-channel detector allows snapshot acquisition up to 128 channels in interlaced mode.

Survey spectra of Cr Kα and Al Ka of Bi

Survey Spectra of Cr Kα and Al Ka

Expanding Extensive Applications Using Two Different Energy X-ray

Information Depth

Here is an example of information from the Si substrate, obtained through PMMA films with different thicknesses, measured using the Al Kα and Cr Kα.
Information depth of using Cr Kα is about three times larger than Al Kα.

Si 2p spectrum from Si substrate detected through PMMA

(Sample Provided by Fujifilm Corporation)

Si 2p Spectrum from Si Substrate Detected through PMMA

Unique Features of the PHI Quantes

Qualitative and Quantitative Analysis Using the Cr Kα

Data processing of the results of the Cr Kα can be performed in the same manner as the conventional XPS using the PHI MultiPak analysis software.

The MultiPak software also includes database of photoelectron peak positions (PeakID) and relative sensitivity factors (RSF) of elements, which are compatible with Cr Kα. RSF database for Cr Kα allows quantitative evaluations as well as Al Kα.

Spectra taken by Al Kα and Cr Kα can be processed simultaneously on the MultiPak, which allows simple comparison and other data processing between results of different X-ray source.

Example of analysis screen by PHI MultiPak

Example of Analysis Screen by PHI MultiPak