NEW
PHI GENESIS
Fully-automated multi-technique scanning XPS/HAXPES microprobe
Products
X-ray Photoelectron Spectroscopy / XPS
NEW
PHI Quantera II
The world's highest performance XPS microprobe that provides automated micro-area spectroscopy.
PHI Quantes
Pioneer into a new area with an XPS equipped with both hard X-ray & conventional soft X-ray source.
PHI X-tool
This high performance scanning XPS instrument comes with a low price yet makes measurements for all types of applications and features easy, intuitive operation.
PHI VersaProbe 4
Multi-technique scanning XPS microprobe that provides the highest performance spectroscopy with a sophisticated equipment design.
Auger Electron Spectroscopy / AES, SAM
PHI 710
The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.
Time-of-Flight SIMS / TOF-SIMS
NEW
PHI nanoTOF 3
This new TOF-SIMS instrument has added new unique features and enhanced automated analysis from sample loading through to measurement.
Dynamic SIMS / D-SIMS
