Fully-automated multi-technique scanning XPS/HAXPES microprobe
The world's highest performance XPS microprobe that provides automated micro-area spectroscopy.
Pioneer into a new area with an XPS equipped with both hard X-ray & conventional soft X-ray source.
This high performance scanning XPS instrument comes with a low price yet makes measurements for all types of applications and features easy, intuitive operation.
Multi-technique scanning XPS microprobe that provides the highest performance spectroscopy with a sophisticated equipment design.
The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.
This new TOF-SIMS instrument has added new unique features and enhanced automated analysis from sample loading through to measurement.