TOF-SIMS spectrum of an organic material with surface contamination removed

2014.08.15 UpdateTOPICS

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TOF-SIMS spectrum of an organic material with surface contamination removed

This shows an example of polymer analysis before and after GCIB ion irradiation.

This shows an example of polymer analysis before and after GCIB ion irradiation. Due to surface cleaning with GCIB, peaks derived from hydrocarbon are decreasing while fragment strengths, which are distinctive of the polymers, hardly changed or even increased. We believe TOF-SIMS analysis with surface contamination removed is possible.

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Fig 1, Comparison of TOF-SIMS spectrum before and after Ar GCIB sputtering of polycarbonate standard sample surface

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Fig 2, Comparison of TOF-SIMS spectrum before and after Ar GCIB sputtering of polyethylene-terephthalate (PET) standard sample surface