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What is the parallel imaging MS/MS option
By equipping TOF-SIMS with the parallel imaging MS/MS option, tandem mass spectrometry of the outermost surface can be achieved with high speed and high sensitivity, enabling simultaneous high-speed m
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What is Hard X-ray Photoelectron Spectroscopy
Background Photoelectron spectroscopy was reported by Kai M. Siegbahn in the 1950s. At that time, he reported the photoelectron spectrum of Cu 1s using Mo Kα radiation¹⁾. Subsequently, there were rep
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About the TRIFT™ Type Analyzer
TRIFT™ type analyzer with high tolerance for surface topography Secondary ions emitted from the sample surface have initial energy and angular distributions. As a result, even ions of the same mass e
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About Gas Cluster Ion Beam
What is the Gas Cluster Ion Beam Gas Cluster Ion Beam (GCIB) technology¹⁾ is a Japanese-originated advanced technology developed at Kyoto University. GCIB is an ion beam formed from several thousand
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