Surface Analysis Technique Seminar & ULVAC-PHI’s User’s Meeting in Singapore
Main topics were:
- Failure Analysis Using XPS (presented by WinTech Nano-Technology Services)
- Recent Expanded Applications of Scanning XPS Microprobe
- Applications of Complicated Inorganic and Organic Matereals Using TRIFT Mass Analyzer
Special thanks to WinTech Nano-Technology Services, for preparing the presentation, and to our agents, Aneric Enterprizes and CoreTech Integrated, for arrangement and support.