June 18 - 20, 2025
Egret Himeji in Himeji, Japan.

Please visit the SISS-24 for more information.

ULVAC-PHI will have a talk.

  ”Surface Characterization of Cutting-edge Energy Devices Using  PHI nanoTOF3+.”,
Gabriele Di Stadio

Abstract

In the last years novel technologies involving sustainable processes have been trending and are rapidly shaping the world, addressing us to new technical challenges that urge to be solved as fast as possible to compete in this exciting new field full of opportunities. The development of sustainable batteries is born from the need to decrease carbon emissions from vehicles and general energy consumption. In a similar way, the development of perovskite-based solar cells is more environmentally friendly compared to Si-based solar cells.

The R&D and the industrial development processes require both innovation and reliability, and this is what ULVAC-PHI offers with PHI nanoTOF3⁺, our latest TOF-SIMS instrument, with its unique LMIG technology, its TRIFT mass analyzer that allows the imaging without shadows of topographic samples and a long list of sputtering options, such as GCIB depth profiling and FIB processing. In this presentation we will introduce the newest TOF-SIMS applications involving materials aiming for more sustainable energy production and electrical devices, highlighting functions such as depth profiling and uneven samples imaging.