SIMS - 22

Event finished. Thank you for participating and we look forward to seeing you again.

SIMS - 22

October 20 - 25, 2019
Miyako Messe
Kyoto, Japan 

If you are attending SIMS-22, please feel free to stop by our booth or attend talks with our scientists scheduled throughout the week:

Gregory Fisher - Wednesday, Oct. 23, 10:20 am, Room 4 (23-3-03)
- Structural assessment of (sub-)monolayer coatings in device processing at high spatial resolving power by TOF-SIMS tandem MS imaging

Shin-ichi Iida - Wednesday, Oct. 23, 3:00 pm, Room 2 (23-1-08)
- TOF-SIMS MS/MS depth profiling of OLED devices for elucidating the degradation process

Hsun-yun Chang - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-42)
- Investigation of gas cluster ion beam for depth profiling of hybrid materials

Miyako Sekiya - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-74)
- Fragmentation pattern of Fatty Acid Amides in TOF-SIMS with Tandem MS

Shin-ichi Iida - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-82)
- Wider Vision Capability of Curved Surface Sample Holder for TOF-SIMS Imaging

Takuya Miyayama - Thursday, Oct. 24, 10:50 am, Room 3 (24-2-02)
- Bismuth attached intact molecular secondary ions [M+Bi]^+ under low-energy bismuth primary ion beam irradiation

Please visit the SIMS-22 website for more information.