Event finished. Thank you for participating and we look forward to seeing you again.
September 15 - 20, 2019
If you are attending ECASIA' 19, please feel free to stop by our booth or attend talks with our scientists scheduled throughout the week:
Kazutoshi Mamiya - Monday, Sept. 16, 4:20 pm, Konferenz 2-3 (K 2-3) - Auger Electron Spectroscopy Analysis of Phase-change Memory Cells
Masahiro Terashima - Monday, Sept. 16, 4:40 pm, Konferenz 2-3 (K 2-3) - The Electronic Band Structure Analysis of OLED Device by Means of in-situ LEIPS and UPS combined with GCIB
Greg Fisher - Tuesday, Sept. 17, 1:50 pm, Konferenz 1 (K 1) - Visualization of Nanoscale Features and Structural Assessment of (sub-)monolayer Coatings in Devices by Tandem MS Imaging
Kateryna Artyushkova - Tuesday, Sept. 17, 4:00 pm, Hall 3 (Plenum) (H 3) - Multi-technique Surface Analysis of Graphenes
Katsumi Watanabe - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - Measurements of Empirical Relative Sensitivity Factors in CrKα X-ray
Ben Schmidt - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - New Analytical Options on PHI VersaProbe III XPS System for Characterization of Electronic Materials
Jennifer Mann - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - Beyond the Surface: Design & Applications of a New Laboratory-Based Scanning XPS/HAXPES Instrument
Ashley Ellsworth - Thursday, Sept. 19, 5:40 pm - Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles
John Newman - Thursday, Sept. 19, 5:40 pm, Hall 2 (H 2) - XPS, TOF-SIMS, and AES Analysis of Fresh and Aged Alumina-Supported Silver Catalysts
Please visit the ECASIA 2019 website for more information.