7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)
Event finished. Thank you for participating and we look forward to seeing you again.
7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)
Date : October 9（Tue.）-12（Fri.）
Place : SINANO, Chinese Academy of Sciences in Suzhou (Jiangsu, China)
Links : http://2018sims.csp.escience.cn/dct/page/1
If you will be at SIMS-China, please stop by our Booth and sit in on the talk that our scientist will be giving.
Ashley A. Ellsworth
“Using TOF-SIMS Tandem MS Imaging to Characterize Organic and Inorganic Materials: Two Case Studies”