News List
We have released the new TOF-SIMS product PHI nanoTOF 3+
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) PHI nanoTOF ３+ Master surface mass spectrometry of micro-areas with this single instrument While inheriting the TRIFT type analyzer (Triple
New XPS instrument PHI GENESIS released!
Fully-automated multi-technique scanning XPS/HAXPES PHI GENESIS ULVAC-PHI integrates every surface analysis technology which is essential for battery research and development into
We have released the new TOF-SIMS product PHI nanoTOF 3
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We have released the new XPS product PHI VersaProbe 4
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PHI 5000 VersaProbe III Introduction of new options
Low-Energy Inverse Photoemission Spectroscopy (LEIPS) KEY FEARURES Obtaining information on unoccupied states from "inverse" photoelectron spectra Measurement of Electron Affinity Low-damage
Notice of sales launch
We are pleased to announce the launch of sales of the high-speed spectroscopic ellipsometer PHI QuickSE. High-speed spectroscopic ellipsometer PHI QuickSE Series NEW Key Features ・
A new product has been released
Scanning dual X-ray photoelectron spectrometer (XPS) PHI Quantes NEW Key Technology ・Scanning dual X-ray photoelectron spectrometer equipped with hard X-ray・Expanded application range wit
A new option has been released
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) MS/MS option NEW Key Technology ■ Mass images and spectra of MS1 and MS2 can be simultaneously acquired and displayed■ MS1 and MS
New products have been posted
Multifunctional scanning X-ray photoelectron spectrometer (XPS) PHI 5000 VersaProbe III NEW Key Technology ・High-sensitivity micro-analysis using proprietary hardware・Highly reliable auto
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