Time-of-flight secondary ion mass spectrometer (TOF-SIMS)
MS/MS option NEW
Key Technology
■ Mass images and spectra of MS1 and MS2 can be simultaneously acquired and displayed
■ MS1 and MS2 cover exactly the same analysis area (because MS1 and MS2 are separated during detection)
■ MS2 spectra can be acquired at high speed and with high mass accuracy
■ MS2 peaks can be selected within a range of minimum 1 Da
Related Information Links
The MS/MS option is being introduced at various events.
Event Report