News List
New product (AES) PHI 4700 Thin Film Analyzer has been posted
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New product (XPS) PHI Quantera II has been posted
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2010年11月より ガスクラスターイオン銃 (GCIB) を搭載した表面分析装置を出荷開始
Shipment of surface analysis instruments equipped with gas cluster ion gun (GCIB) began in November 2010 [TOF-SIMS High Spatial Resolution Mass Imaging] Fig 1. Positive ion TOF-SIMS mass images o
New product (XPS) PHI VersaProbe II has been posted
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New product (XPS) PHI X-tool has been posted
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New product (AES) PHI 710 has been posted
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New products have been posted
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An “Update Category” has been added to the product information
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New products have been posted
Multifunctional scanning X-ray photoelectron spectrometer (XPS) PHI 5000 VersaProbe III NEW Key Technology ・High-sensitivity micro-analysis using proprietary hardware・Highly reliable auto
A new option has been released
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) MS/MS option NEW Key Technology ■ Mass images and spectra of MS1 and MS2 can be simultaneously acquired and displayed■ MS1 and MS
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