Event Information
- 会期
- 2024.07.12（金）
- 会場
- Mita NN Hall (Tokyo)
We are pleased to announce that our well-received Technical Symposium will be held again this year.
We look forward to welcoming you.
Event Overview
Date and Time: July 12, 2024 (Friday), 13:00–17:00 (Registration opens at 12:30)
Venue: Mita NN Hall (Tokyo)
Program
| 13:00 Opening Shinichi Iida, Product Strategy Department, ULVAC-PHI, Inc. “Automated Measurement in TOF-SIMS: Toward Efficient Data Collection“ ULVAC-PHI, Inc., Masahiro Terashima “Evaluation of Semiconductor Materials Using PHI GENESIS“ ー Break ー 14:20 Mr. Kenji Nagata, Center for Basic Research on Materials, National Institute for Materials Science (NIMS) “Spectral Analysis Enabled by Bayesian Estimation and Its Application to XPS Measurement” 15:05 Mr. Junichiro Sameshima, General Manager, Surface Science Research Department, Toray Research Center, Inc. “Application Examples of Surface Analysis Methods in Industry” ― Break ― 16:15 Prof. Akinobu Teramoto, Director, Research Institute for Semiconductor Technology, Hiroshima University “Surface and Interface Analysis of Thin Films in Semiconductor Devices” 17:00 Closing Social Gathering ※ The schedule is subject to change depending on the progress of the event. |
Notices and Precautions
- Participation is free of charge.
- Participation is limited to our customers.
- Registration will close once capacity is reached.
- The program is subject to change without notice.
- The program for the event will be updated on this page as information becomes available.
Venue Information
Mita NN Hall 【Access】
B1F, Mita NN Building, 4-1-23 Shiba, Minato-ku, Tokyo
5-minute walk from Tamachi Station (Mita Exit / West Exit) on the JR Yamanote Line / Keihin-Tohoku Line
Direct access from Mita Station on the Toei Mita Line (Exit A9) / 3-minute walk from Mita Station on the Toei Asakusa Line