Dynamic-SIMS Ultra Basic Course

Online Seminars 2026.02.25

Event Information

会期
2026.02.25（水）
対象
General
関連リンク

[Overview]
Dynamic-SIMS (D-SIMS) is an analytical technique capable of evaluating the depth distribution of elements with extremely high sensitivity, and is used in a wide range of fields including materials, semiconductors, and thin film evaluation. In this webinar, we will review the basic principles of SIMS, then explain the differences from other techniques, how to read depth profiles, and the effects of different measurement conditions. This is an ultra-basic course for those who have just started using D-SIMS or those who wish to make better use of D-SIMS.

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