The SurfaceSpectra product is a virtual treasure trove of “experience” and “wisdom” that supports surface analysis.
SurfaceSpectra provides knowledge system to support practical analysis mainly by way of a static SIMS database and polymer XPS spectrum database.
Features
Edited by John C. Vickerman and David Briggs
This book is an English version of an instruction manual for TOF-SIMS (Time-of-flight Secondary Ion Mass Spectrometry).Conventional textbooks for surface analysis include some descriptions of Static SIMS and TOF-SIMS. However there is currently no comprehensive manual for TOF-SIMS which has recently become essential for SIMS.
This is the first book that gives extensive fundamental knowledge of TOF-SIMS and its multi-faceted applications.
The second edition additionally describes usage of cluster ions over a wide range.
Main Contents
- TOF-SIMS instruments
- The Fundamentals of Secondary Ion Formation (experiment and theory)
- Experimental Methods for Optimizing the TOF-SIMS Experiment
- Spectral Data Interpretation
- Analytical Applications
The “analytical applications” are given specific and detailed coverage in this book.
For those who want to learn more about TOF-SIMS, please visit our “What is TOF-SIMS” page, where we introduce the principles and features of TOF-SIMS.
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For purchase inquiries and questions, please contact us via the ULVAC-PHI Sales Department inquiry form.