Event Information
- 会期
- 2021.02.05（金）
- 会場
- Online (Zoom to be used)
This event will be held online for users of our surface analysis instruments (XPS, AES, SIMS).
We hope this event will serve as an opportunity to resolve everyday questions about your instruments, exchange information, and gain useful insights for the future. As a feature unique to the online format, we are also planning an online networking session. In addition, we have prepared a gift for all participants, so we warmly encourage you to join us!
Event Date, Time, and Format (Joint session for XPS, AES, and SIMS)
Participation in this event is limited to users of our surface analysis instruments.
Date and Time: February 5, 2021 (Friday), 13:00–17:00 Format: Online via Zoom
Please refer to this page for the registration and participation process.
Program
| 12:30 Zoom room opens 13:00 Opening / User Presentation ■ Ms. Yasuko Kajiwara, Murata Manufacturing Co., Ltd. “XPS Auger Spectrum Analysis Using a Top-Hat Filter” ■ Mr. Toshiro Nishi, Sony Corporation “Analysis of Organic Thin Films Using GCIB-UPS” ― Break ― ■ Mr. Ryota Imaki, Nippon Steel Technology Co., Ltd. “Vacuum Fracture Analysis by AES” ■ Mr. Keiji Tokuda, Gunma Industrial Technology Center “Analysis of Industrial Materials by TOF-SIMS” ― Break ― 15:00 From ULVAC-PHI Latest software information / Introduction of the latest applications Introduction of the XPS Guidebook, etc. ※ A short break will be included during this session. 17:00 Closing ※ An online networking session will be held following the Users Meeting. ※ The schedule is subject to change depending on the progress of the event. |
About the Networking Session
An online networking session will be held following the Users Meeting.
・System to be used: REMO
Please join the networking session using the URL provided in a separate invitation email (different from the Users Meeting Zoom invitation). ・Email subject: [ULVAC-PHI] ◆ Users Meeting Networking Session Invitation
About Using REMO
To ensure smooth participation on the day of the event, please create an account in advance.
Detailed instructions on how to participate on the day of the event will be provided when the invitation email is sent.
“XPS Guidebook” gift for participants on the day
One hundred participants will be selected by lottery from those who attend this Users Meeting to receive the “XPS Guidebook (English)”, which the American Vacuum Society (AVS) is planning to publish. The guidebook is expected to cover a comprehensive range of topics, from basic XPS knowledge and sample preparation to measurement and analysis, as well as methods for ensuring data reproducibility and accuracy. An introduction to this guidebook will also be presented at the Users Meeting. We encourage you to consider joining us.
Notices and Precautions
- The schedule is subject to change without notice.
- Participation in this event, including the networking session, is free of charge.
- Participation in this event is limited to users of our surface analysis instruments.
- Registration will close once capacity is reached.
- The program and details for the event will be updated on this page as they become available.