Event Information
- 会期
- 2026.07.22（水）
- 対象
- General
Session 1: What Can TOF-SIMS Tell Us?
TOF-SIMS is a technique capable of highly sensitive analysis of elements and molecules present on surfaces. This seminar introduces what TOF-SIMS can reveal, and provides an easy-to-understand explanation of the fundamental principles from primary ion irradiation and secondary ion generation to time-of-flight mass spectrometry.