HAXPES, like XPS, enables highly reliable spectrum acquisition, expanding the possibilities of surface analysis. The detection depth and range of orbital selection have been broadened, and the applicable range of angle-resolved XPS has also been extended.
New applications can be expected, not only for conventional surface analysis, but also for the analysis of buried interfaces and the detection of interfaces.
As the latest technical reference material, we have published the presentation materials from our lecture at the technical symposium held in July 2023.
HAXPES Related Information
Instrument Information
Surface Analysis Topics
- PHI Quantes equipped with scanning dual monochromatic X-rays
- What is Hard X-ray Photoelectron Spectroscopy
Related Instruments Links
X-ray Photoelectron Spectrometer XPS
