The SurfaceSpectra product is a virtual treasure trove of “experience” and “wisdom” that supports surface analysis.
SurfaceSpectra provides knowledge system to support practical analysis mainly by way of a static SIMS database and polymer XPS spectrum database.
Features
Edited by David Briggs and John T. Grant
This book is an English instruction manual for AES (Auger Electron Spectroscopy) and XPS (X-ray Photoelectron Spectroscopy) that was edited as the current revision of “Practical Surface Analysis”, the first volume of which is an established formal text book edited by Briggs and Seah.
Currently, AES and XPS are widely available as analytical methods for surfaces and interfaces. The last 10 years have seen remarkable progress in these methods and instruments.
This book is updated to include the latest data and summarized for use as a reference that researchers and analyst should always keep close at hand for quick reference.
For those who want to learn more about AES and XPS, please visit our “What is AES / What is XPS” pages, where we introduce the principles and features of each technique.
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