On Friday, February 14, 2020, we held our Users Meeting at Fukuracia Yaesu. Two users delivered very interesting presentations, and from our side, we gave presentations including a basic course, academic conference reports, and a presentation on GCIB. The event was fully booked on the day and concluded successfully.
We would like to once again express our sincere gratitude to Ms. Reiko Ikeda of Kao Corporation and Mr. Shinsuke Nishida of Furukawa Electric Co., Ltd. for their presentations.
We will introduce the highlights of the day in the order of the program.
＞ Click here for the program on the day
From the ULVAC-PHI Analysis Department
Special Edition Basic Course
First, our Analysis Department conducted a “Special Edition Basic Course.” For this session, we collected questions in advance that attendees felt they could no longer ask, as well as issues they were struggling with, and presented answers in response to those submissions.
The “Surface Analysis Basic Course” — a collection of answers from the basic course — is available exclusively to Club PHI instrument user members.
International Conference Report
Next, we introduced the international conferences held in 2019 — “ECASIA’19,” “AVS 66th,” “SIMS-22,” and “PSA-19” — focusing on presentations from our company and PHI USA.
Presentations
“Functional Research on Materials and Products through Surface Analysis”
Ms. Reiko Ikeda
Institute of Analytical Science, Kao Corporation
The Institute of Analytical Science at Kao Corporation conducts analysis and research on a wide variety of materials and products handled by the company, spanning a very broad range of fields from household and personal care products to cosmetics and chemicals. On this occasion, Ms. Ikeda introduced examples of functional analysis using TOF-SIMS on familiar everyday items.
The case studies covered a diverse range of applications: analysis of the “light scattering effect” that makes teeth appear whiter through depth profiling from the surface and fluoride distribution analysis of cross-sections; verification of “improvement of the skin’s barrier function” through penetration state analysis of cross-sections of the stratum corneum tissue (5–10 μm thickness) on the skin surface; and “functional analysis of surface modifiers” through water repellency and component distribution of silicone formulation-coated surfaces.
The direct functional verification that takes advantage of the features of TOF-SIMS was presented in a very easy-to-understand manner, making surface analysis feel very accessible. It was a presentation that raised great expectations for new material development and products in the future.
“Chemical State Analysis of Buried Interfaces Using PHI Quantes”
Mr. Shinsuke Nishida
Analysis Technology Center, Advanced Technology Research Institute
Research and Development Division, Furukawa Electric Co., Ltd.
Mr. Nishida of Furukawa Electric Co., Ltd. presented the latest analysis examples using the PHI Quantes introduced in 2018. There has been a great deal of interest and inquiries about PHI Quantes, and many users were looking forward to this presentation.
The presentation was full of compelling content about the advantages of PHI Quantes: avoidance of peak overlap using two X-ray sources, analysis of buried interfaces in multilayer films with a thickness of 10 nm or more, and application to angle-resolved analysis. Furthermore, the comparison of PHI Quantes’ performance with measurement results from SPring-8 (synchrotron radiation facility) was also very interesting.
Even users without experience in hard X-ray photoelectron spectroscopy (HAXPES) found the strengths and weaknesses of the technique easy to understand, and we received feedback such as “This was a very valuable opportunity.”
PHI Quantes has already been shipped and delivered to locations around the world, and we look forward to the further expansion of techniques using hard and soft X-rays.
From ULVAC-PHI
Reconsidering GCIB — How Far Has Its Application to Inorganic Materials Advanced?
Following a coffee break, our Analysis Department presented a review of the applications of gas cluster ion beam in XPS, from surface cleaning to chemical state analysis of inorganic oxides.
Announcements from the Sales Department
Finally, our Sales Department provided the latest information, including the new option for “PHI Quantes” — the “Ar monomer/GCIB dual ion gun.”
The materials presented by our company at the Users Meeting (distributed materials) are available for download in the “Past Presentation Materials” section of the Club PHI instrument user member content, so please make use of this resource.
（Note: “Past Presentation Materials” is available exclusively to instrument user members. We ask for your understanding that Club PHI (general) members are not able to access this content.）
Related Product Links
Content for Club PHI Members
The materials presented by our company at this Users Meeting are available exclusively to Club PHI “Instrument User Members.”
2020 Users Meeting (only our company’s presentations included)
- Special Edition Basic Course “Surface Analysis Basic Course”
- International Conference Report (PDF / 12,692.57 KB)
- Reconsidering GCIB (PDF / 3,987.77 KB)
- Announcements from the Sales Department (PDF / 709.00 KB)
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