Event Information
- 会期
- 2022.02.18（金）
- 会場
- Hybrid event (Tokyo, Live streaming)
The Tokyo venue session has been cancelled, and the event will be held online only.
We will be holding a Users Meeting for users of our surface analysis instruments (XPS, AES, SIMS).
We hope this will serve as an opportunity to resolve everyday questions about your instruments and exchange useful information.
Event Date, Time, and Format (Joint session for XPS, AES, and SIMS)
Participation in this event is limited to users of our surface analysis instruments.
Event Date and Time: February 18, 2022 (Friday), 13:00–17:00
Format: Hybrid (Tokyo venue and live streaming)
→ Online via Zoom
– Tokyo venue: Bellesalle Yaesu [Capacity: 50]
– Online: Zoom Webinar
＜Registration has closed＞
【ご案内】
＊お申し込みの際に「会場」を選択された方も、再度のお申し込みや変更のご連絡は不要です。
＊お申し込みいただいた方には、開催前日および当日、Zoom参加のご案内をお送りします。
Program
| 12:30 Zoom room opens 13:00 Opening User Presentation ■ Mr. Hideyuki Taguchi, Nihon Parkerizing Co., Ltd. ”Effects of Charging and Countermeasures in XPS Depth Profile Analysis of Conversion Coating Films” ■ Mr. Yutaka Hoshina, Sumitomo Electric Industries, Ltd. “Surface Analysis Utilizing Original Data Analysis Technology” ■ Mr. Tsubasa Yabuchi, Kao Corporation ”Compositional and Structural Analysis of Liquid Samples by Cryo-TOF-SIMS/SEM” 14:50 From ULVAC-PHI □ Introduction of new products □ Announcements from the Sales Department □ Introduction of previously received Q&A 17:00 Closing ※ Two breaks will be included during the event. ※ The schedule is subject to change depending on the progress of the event. |
Notices and Precautions
- The schedule is subject to change without notice.
- Participation in this event is limited to users of our surface analysis instruments.
- Registration will close once capacity is reached.
- The program and details for the event will be updated on this page as they become available.