Event Information
- 会期
- 2023.02.17（金）
- 会場
- Architectural Institute of Japan Hall (Tokyo)
We will be holding a Users Meeting for users of our surface analysis instruments (XPS, AES, SIMS). Web streaming will also be available for viewing for a limited period after the event.
Event Overview
Date and Time: February 17, 2023 (Friday), 13:00–17:00 (Registration opens at 12:30)
Venue: Architectural Institute of Japan Hall (Tokyo) ※ Web streaming available at a later date
＊＊＊ Notices and Requests ＊＊＊
Architectural Institute of Japan Hall Access: https://www.aij.or.jp/map.html
Additional information, including speaker details, will be updated as it becomes available.
– [In-person attendance] If you need to cancel after registering, please notify us.
– Those who have registered for [in-person attendance] will also be able to view the [web streaming] at a later date.
A separate viewing guide will be sent to you, so no additional registration for [web streaming] is required.
Lecture Content
| 13:00 Opening User Presentations ■ Mr. Fumiyuki Toko, Fuji Electric Co., Ltd. ”Introduction to Evaluation Examples of Various Surface Analyses Including XPS ～ Surface State Evaluation of Cu Materials and DLC Films ～” ■ Mr. Hiroto Ito, Mr. Kazuhiro Oikawa, Mr. Kenichi Tabata, Konica Minolta, Inc. ”Analysis Examples of Organic Thin Films by TOF-SIMS (Organic EL)” 14:30 From ULVAC-PHI □ Introduction of Elite [Latest analysis software for XPS and AES] □ Introduction of PHI S3 (S-Cube) [Operating software for the new product GENESIS] □ Introduction of the LEIPS database □ Introduction of the HAXPES database □ Introduction of FAQ [Frequently received inquiries from the lab, to be published on the website] □ Report on participation in SIMS 23 (international conference) 17:00 Closing ※ Two breaks will be included during the event. ※ The schedule is subject to change depending on the progress of the event. |
