JASIS 2019 was held over three days from Wednesday, September 4, 2019, at Makuhari Messe International Conference Center.
Many customers visited our booth and our presentation at the New Technology Presentation.
Exhibition Booth
New Technology Presentation
What can you learn with TOF-SIMS equipped with MS/MS?
We introduced what can be learned by equipping TOF-SIMS with MS/MS, using case examples.
Opening up new application fields for XPS! Latest option examples for multifunctional XPS
We introduced the latest measurement examples using LEIPS (Low-Energy Inverse Photoemission Spectroscopy) and EELS (Electron Energy Loss Spectroscopy).
Materials distributed at the New Technology Presentation are available for download in the “Past Presentation Materials” section of the Club PHI instrument user member content. Please make use of this resource.
（Note: “Past Presentation Materials” is available exclusively to instrument user members. Please note that Club PHI (general) members are not able to access this content.）
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Content for Club PHI Members
Those registered as Club PHI members can download various materials.
(Content accessible may be restricted depending on membership type)
The following presentation materials are available exclusively to “Instrument User Members”.
2019 JASIS New Technology Presentation
- What can you learn with TOF-SIMS equipped with MS/MS? （PDF/1,865.06 KB)
- Opening up new application fields for XPS! Latest option examples for multifunctional XPS (PDF / 2,462.21 KB)
Member registration is required to download.
We apologize for the inconvenience, but please register for membership here.