Operating procedure for mosaic mapping by XPS

Online Seminars 2025.08.26

Event Information

会期
2025.08.26(火)
対象
Users of our surface analysis instruments
関連リンク

[Overview]
We will introduce a method for automatically acquiring wide-area mosaic maps by moving the stage, utilizing scanning X-ray-excited secondary electron imaging (SXI), a proprietary technology of PHI XPS instruments. We will provide an easy-to-understand explanation of how to use mosaic mapping to visualize differences in composition and chemical state across the entire sample beyond the range of 1400 μm × 1400 μm, along with actual measurement examples.

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