[Overview]
We will introduce a method for automatically acquiring wide-area mosaic maps by moving the stage, utilizing scanning X-ray-excited secondary electron imaging (SXI), a proprietary technology of PHI XPS instruments. We will provide an easy-to-understand explanation of how to use mosaic mapping to visualize differences in composition and chemical state across the entire sample beyond the range of 1400 μm × 1400 μm, along with actual measurement examples.
Operating procedure for mosaic mapping by XPS
CONTACT
Feel free to contact us with any questions about our products, analysis services, or careers.