[Overview]
Dynamic-SIMS (D-SIMS) is a surface analysis technique with high sensitivity and high depth resolution, but its condition setting and interpretation can be challenging due to factors such as mass interference and matrix effects. This seminar is designed for those who have just started using the instrument, those with several years of experience, and those who are already utilizing data, and will provide an easy-to-understand explanation of measurement condition concepts, quantification, mass interference, and differences from other techniques.
Dynamic-SIMS Basic Course
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