ULVAC-PHI Users Meeting

Users Meeting 2025.02.07

Event Information

会期
2025.02.07(金)
会場
Architectural Institute of Japan Hall
関連リンク
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This event is open to users of our surface analysis instruments (XPS, AES, SIMS).

We hope this will serve as an opportunity to resolve everyday questions about your instruments and gain useful information for the future. We look forward to your participation.

Event Overview

Date and Time: February 7, 2025 (Friday), 13:00–17:00 (Registration opens at 12:30) Venue: Architectural Institute of Japan Hall

– Architectural Institute of Japan Hall Access https://www.aij.or.jp/map.html

Program



13:00 Opening

User Presentations

  • Mr. Yohei Murayama, Canon Inc. “Introduction of Analysis Examples of Toner Particles by TOF-SIMS”
  • Dr. Teruhisa Otsuka, National Institute of Advanced Industrial Science and Technology (AIST) “Introduction of the ALD-combined XPS Analytical Instrument at AIST NPF and Its Analysis Examples”
  • Mr. Hideyuki Taguchi, Nihon Parkerizing Co., Ltd. “Study on Acceleration of XPS Measurement Using Bayesian Spectral Super-Resolution”

From ULVAC-PHI

  • Introduction of Applications
    • XPS and HAXPES analysis examples utilizing the difference in information depth between Al Kα and Cr Kα radiation
    • Frontiers of analysis examples using the latest TOF-SIMS instruments
  • Introduction of remote connection
    • We will demonstrate the actual remote operation and diagnostics
16:40 Closing 17:00 Social Gathering
※ Multiple breaks will be included during the event.
※ The schedule is subject to change depending on the progress of the event.

CONTACT

Feel free to contact us with any questions about our products, analysis services, or careers.