Shipment of surface analysis instruments equipped with gas cluster ion gun (GCIB) began in November 2010
[TOF-SIMS High Spatial Resolution Mass Imaging]
Fig 1. Positive ion TOF-SIMS mass images of mouse brain sections, hippocampus, and pyramidal cells:
Comparison after freeze-drying and after surface etching of approximately 10 nm by Ar-GCIB (field of view: 100 μm)
Fig 2. Positive ion TOF-SIMS mass images of mouse brain sections, hippocampus, and pyramidal cells after surface etching of approximately 10 nm by Ar-GCIB (field of view: 100 μm)
Figures 1 and 2 show the results of mass imaging observation of hippocampal pyramidal cells in a mouse brain section (Caudal Diencephalon) with a field of view of 100 μm. The beam diameter for TOF-SIMS measurement is approximately 600 nm, and the measurement time is approximately 20 minutes in each case. Ar GCIB etching treatment (equivalent to 10 nm) removes phospholipids from the cell surface, making it possible to clearly observe pyramidal cells that were not clearly visible before treatment. It is expected that high spatial resolution molecular imaging by TOF-SIMS will be greatly advanced through the use of GCIB. (Sample provided by: Prof. Akaboshi, Keio University)