Low-Energy Inverse Photoemission Spectroscopy (LEIPS)
KEY FEARURES
- Obtaining information on unoccupied states from “inverse” photoelectron spectra
- Measurement of Electron Affinity
- Low-damage analysis of organic materials
- Same-point analysis with XPS and UPS
Reflection Electron Energy Loss Spectroscopy (REELS)
KEY FEARURES
- Analysis of electronic states and bonding states at the surface
- Band gap measurement of semiconductors
- Comparison of relative hydrogen content
- Identification of sp2/sp3 bonding of carbon