Event Information
- 会期
- 2026.10.25（日） — 30（金）
- 会場
- Guangzhou, China
当社および爱发科费恩斯（南京）仪器有限公司から下記内容で発表いたします。
- Linhua Tan — ULVAC-PHI, Inc.
Cryo Q-SIMS for Reliable Depth Profiling of Alkali Ions in SiO₂ - Gabriele Di Stadio, PhD — ULVAC-PHI, Inc.
Integrated TOF-SIMS/MALDI-TOF Platform for Multimodal Molecular Imaging of Mouse Cerebellum - Xiujuan Shi — ULVAC-PHI Nanjing
ToF-SIMS Study on the Interfacial Structure and Formation Mechanism of Black Decorative Layer of Cizhou Kiln White-Ground Black-flower Porcelain - Shin-ichi Iida, Ph.D. — ULVAC-PHI, Inc.
Complementary SIMS Solutions from ULVAC-PHI - Tomomi Ohashi — ULVAC-PHI, Inc.
Quantitative Comparison of Trace Impurities in Cu Thin Films via Oxygen-Controlled D-SIMS Analysis - Zhiqin Ding — ULVAC-PHI Nanjing
TOF-SIMS Technology for Characterizing Covalently Linked Self-Assembled Bilayer Structures - Ou Yang — ULVAC-PHI Nanjing
Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in the Analysis of Organic Matter in Extraterrestrial Samples