{"id":1355,"date":"2015-09-29T16:27:00","date_gmt":"2015-09-29T07:27:00","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/news\/msms-11\/"},"modified":"2026-08-10T17:25:40","modified_gmt":"2026-08-10T08:25:40","slug":"msms-11","status":"publish","type":"news","link":"https:\/\/www.ulvac-phi.com\/en\/news\/msms-11\/","title":{"rendered":"Presentation on the Imaging MS\/MS option that opens up new possibilities for TOF-SIMS"},"content":{"rendered":"\n

ULVAC-PHI, Inc. and Physical Electronics USA, Inc. presented five papers at the 20th International Conference on Secondary Ion Mass Spectrometry (SIMS-XX) held in Seattle, including collaborative research results with Maastricht University on the Imaging MS\/MS option for the PHI nanoTOF II\u2122.<\/p>\n\n

A New Instrument for Parallel TOF-SIMS and MS\/MS Data Acquisition<\/h2>\n\n

P.E. Larson, G.L. Fisher, J.S. Hammond, Physical Electronics, R.M.A. Heeren, Maastricht University, Scott R. Bryan, Physical Electronics<\/p>\n\n

Imaging of Molecular Chemistry in Biological Specimens by Next-Generation TOF-SIMS<\/h2>\n\n

Greg L. Fisher, Physical Electronics, N. Ogrinc Potocnik, A.L. Bruinen, B. Flinders, Maastricht University, T. Miyayama, S. Iida, ULVAC-PHI, J.S. Hammond, S.R. Bryan, Physical Electronics, R.M.A. Heeren, Maastricht University<\/p>\n\n

TOF-SIMS Imaging MS\/MS of Polymer Additives<\/h2>\n\n

John S. Hammond, P.E. Larson, G.L. Fisher, Physical Electronics, T. Miyayama, ULVAC-PHI, D.M. Carr, S.R. Bryan, Physical Electronics<\/p>\n\n

Biomolecular Investigation of Neurodegenerative Diseases of Brian Plasticity with TOF-SIMS Tandem Imaging MS<\/h2>\n\n

Nina Ogrinc Potocnik, Maastricht University, G.L. Fisher, Physical Electronics, J. Praet, J. Hamaide, University of Antwerp, A.L. Bruinen, Maastricht University, A. Van Der Linden, University of Antwerp, R.M.A. Heeren, Maastricht University<\/p>\n\n

High Resolution TOF-SIMS Tandem Imaging MS of Lipid Species in Infected Thin Tissue Sections<\/h2>\n\n

Anne L. Bruinen, Maastricht University, G.L. Fisher, Physical Electronics, A.M. Van Der Sar, VU University, N. Ogrinc Potocnik, R.M.A. Heeren, Maastricht University <\/p>\n\n

This new Imaging MS\/MS option (patented) features high-speed parallel imaging capability not found in conventional TOF-TOF type tandem mass spectrometers, enabling simultaneous acquisition of spectra, images, and depth profiles using the Imaging MS\/MS option alongside conventional TOF-SIMS measurements. The presentation, which demonstrated new possibilities for TOF-SIMS, received a great deal of response from the audience.<\/p>\n\n

Next month, the Imaging MS\/MS option will be installed as a \u03b2-version on the PHI nanoTOF II\u2122 at Maastricht University. Development is progressing in collaboration with the group of Prof. Ron Heeren at the university, with commercialization planned for June 2016.<\/p>\n\n

For questions and inquiries, please click here<\/a><\/p>\n","protected":false},"featured_media":0,"template":"","news-category":[22],"class_list":["post-1355","news","type-news","status-publish","hentry","news-category-information"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t