{"id":936,"date":"2020-05-29T11:58:00","date_gmt":"2020-05-29T02:58:00","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/events\/um20\/"},"modified":"2026-07-14T15:31:03","modified_gmt":"2026-07-14T06:31:03","slug":"um20","status":"publish","type":"events","link":"https:\/\/www.ulvac-phi.com\/en\/events\/um20\/","title":{"rendered":"Event Report: 2020 Users Meeting"},"content":{"rendered":"\n

On Friday, February 14, 2020, we held our Users Meeting at Fukuracia Yaesu. Two users delivered very interesting presentations, and from our side, we gave presentations including a basic course, academic conference reports, and a presentation on GCIB. The event was fully booked on the day and concluded successfully.We would like to once again express our sincere gratitude to Ms. Reiko Ikeda of Kao Corporation and Mr. Shinsuke Nishida of Furukawa Electric Co., Ltd. for their presentations.We will introduce the highlights of the day in the order of the program.<\/p>\n\n

\uff1e Click here for the program on the day<\/a><\/p>\n\n

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From the ULVAC-PHI Analysis Department<\/h3>\n\n

Special Edition Basic Course<\/span><\/strong><\/p>\n\n

First, our Analysis Department conducted a “Special Edition Basic Course.” For this session, we collected questions in advance that attendees felt they could no longer ask, as well as issues they were struggling with, and presented answers in response to those submissions. <\/p>\n\n

The “Surface Analysis Basic Course” \u2014 a collection of answers from the basic course \u2014 is available exclusively to Club PHI instrument user members.<\/p>\n\n

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International Conference Report<\/span><\/strong><\/p>\n\n

Next, we introduced the international conferences held in 2019 \u2014 “ECASIA’19,” “AVS 66th,” “SIMS-22,” and “PSA-19” \u2014 focusing on presentations from our company and PHI USA.<\/p>\n\n

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Presentations<\/h2>\n\n

“Functional Research on Materials and Products through Surface Analysis”<\/strong><\/h3>\n\n
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Ms. Reiko IkedaInstitute of Analytical Science, Kao Corporation<\/strong><\/p>\n\n

The Institute of Analytical Science at Kao Corporation conducts analysis and research on a wide variety of materials and products handled by the company, spanning a very broad range of fields from household and personal care products to cosmetics and chemicals. On this occasion, Ms. Ikeda introduced examples of functional analysis using TOF-SIMS on familiar everyday items.<\/p>\n\n

The case studies covered a diverse range of applications: analysis of the “light scattering effect” that makes teeth appear whiter through depth profiling from the surface and fluoride distribution analysis of cross-sections; verification of “improvement of the skin’s barrier function” through penetration state analysis of cross-sections of the stratum corneum tissue (5\u201310 \u03bcm thickness) on the skin surface; and “functional analysis of surface modifiers” through water repellency and component distribution of silicone formulation-coated surfaces.<\/p>\n\n

The direct functional verification that takes advantage of the features of TOF-SIMS was presented in a very easy-to-understand manner, making surface analysis feel very accessible. It was a presentation that raised great expectations for new material development and products in the future.<\/p>\n\n

“Chemical State Analysis of Buried Interfaces Using PHI Quantes”<\/strong><\/h3>\n\n
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Mr. Shinsuke NishidaAnalysis Technology Center, Advanced Technology Research InstituteResearch and Development Division, Furukawa Electric Co., Ltd.<\/strong><\/p>\n\n

Mr. Nishida of Furukawa Electric Co., Ltd. presented the latest analysis examples using the PHI Quantes introduced in 2018. There has been a great deal of interest and inquiries about PHI Quantes, and many users were looking forward to this presentation.<\/p>\n\n

The presentation was full of compelling content about the advantages of PHI Quantes: avoidance of peak overlap using two X-ray sources, analysis of buried interfaces in multilayer films with a thickness of 10 nm or more, and application to angle-resolved analysis. Furthermore, the comparison of PHI Quantes’ performance with measurement results from SPring-8 (synchrotron radiation facility) was also very interesting.<\/p>\n\n

Even users without experience in hard X-ray photoelectron spectroscopy (HAXPES) found the strengths and weaknesses of the technique easy to understand, and we received feedback such as “This was a very valuable opportunity.”<\/p>\n\n

PHI Quantes has already been shipped and delivered to locations around the world, and we look forward to the further expansion of techniques using hard and soft X-rays.<\/p>\n\n

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From ULVAC-PHI<\/h2>\n\n

Reconsidering GCIB \u2014 How Far Has Its Application to Inorganic Materials Advanced?<\/span><\/strong><\/p>\n\n

Following a coffee break, our Analysis Department presented a review of the applications of gas cluster ion beam in XPS, from surface cleaning to chemical state analysis of inorganic oxides.<\/p>\n\n

Announcements from the Sales Department<\/strong><\/p>\n\n

Finally, our Sales Department provided the latest information, including the new option for “PHI Quantes” \u2014 the “Ar monomer\/GCIB dual ion gun.”<\/p>\n\n

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The materials presented by our company at the Users Meeting (distributed materials) are available for download in the “Past Presentation Materials<\/a>” section of the Club PHI instrument user member content, so please make use of this resource.<\/p>\n\n

\uff08Note: “Past Presentation Materials” is available exclusively to instrument user members. We ask for your understanding that Club PHI (general) members are not able to access this content.\uff09<\/p>\n\n

Related Product Links<\/h2>\n\n
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PHI Quantes<\/p>\n\n\n\n

Read more<\/a><\/p>\n<\/div>\n\n\n\n

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PHI 5000 VersaProbe III<\/p>\n\n\n\n

Read more<\/a><\/p>\n<\/div>\n\n\n\n

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PHI nanoTOF II\u2122<\/p>\n\n\n\n

Read more<\/a><\/p>\n<\/div>\n<\/div>\n\n

Content for Club PHI Members<\/h2>\n\n

The materials presented by our company at this Users Meeting are available exclusively to Club PHI “Instrument User Members.”<\/p>\n\n

2020 Users Meeting (only our company’s presentations included)<\/strong><\/p>\n\n