{"id":891,"date":"2026-02-25T17:50:51","date_gmt":"2026-02-25T08:50:51","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/events\/20260225\/"},"modified":"2026-07-14T12:44:02","modified_gmt":"2026-07-14T03:44:02","slug":"20260225","status":"publish","type":"events","link":"https:\/\/www.ulvac-phi.com\/en\/events\/20260225\/","title":{"rendered":"Dynamic-SIMS Ultra Basic Course"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\"><strong>[Overview]<\/strong><br\/>Dynamic-SIMS (D-SIMS) is an analytical technique capable of evaluating the depth distribution of elements with extremely high sensitivity, and is used in a wide range of fields including materials, semiconductors, and thin film evaluation. In this webinar, we will review the basic principles of SIMS, then explain the differences from other techniques, how to read depth profiles, and the effects of different measurement conditions. 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