{"id":873,"date":"2026-06-19T12:21:28","date_gmt":"2026-06-19T03:21:28","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/events\/um\/"},"modified":"2026-07-14T11:07:11","modified_gmt":"2026-07-14T02:07:11","slug":"um","status":"publish","type":"events","link":"https:\/\/www.ulvac-phi.com\/en\/events\/um\/","title":{"rendered":"ULVAC-PHI Users Meeting"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">This event is open to users of our surface analysis instruments (XPS, AES, SIMS).<\/p>\n\n<p class=\"wp-block-paragraph\">We hope this will serve as an opportunity to resolve everyday questions about your instruments and gain useful information for the future. We look forward to your participation.<\/p>\n\n<h2 class=\"wp-block-heading\">Event Overview<\/h2>\n\n<p class=\"wp-block-paragraph\"><strong>Date and Time: February 7, 2025 (Friday), 13:00\u201317:00 (Registration opens at 12:30) Venue: Architectural Institute of Japan Hall<\/strong><\/p>\n\n<p class=\"wp-block-paragraph\">&#8211; Architectural Institute of Japan Hall Access <a href=\"https:\/\/www.aij.or.jp\/map.html\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/www.aij.or.jp\/map.html<\/a><\/p>\n\n<h2 class=\"wp-block-heading\">Program<\/h2>\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><td>13:00\u3000Opening<\/td><\/tr><tr><td>\n<h3>User Presentations<\/h3>\n<ul>\n<li><strong>Mr. Yohei Murayama, Canon Inc.<\/strong> &#8220;Introduction of Analysis Examples of Toner Particles by TOF-SIMS&#8221;<\/li>\n<li><strong>Dr. Teruhisa Otsuka, National Institute of Advanced Industrial Science and Technology (AIST)<\/strong> &#8220;Introduction of the ALD-combined XPS Analytical Instrument at AIST NPF and Its Analysis Examples&#8221;<\/li>\n<li><strong>Mr. Hideyuki Taguchi, Nihon Parkerizing Co., Ltd.<\/strong> &#8220;Study on Acceleration of XPS Measurement Using Bayesian Spectral Super-Resolution&#8221;<\/li>\n<\/ul>\n<\/td><\/tr><tr><td>\n<h3>From ULVAC-PHI<\/h3>\n<ul>\n<li><strong>Introduction of Applications<\/strong><ul>\n<li>XPS and HAXPES analysis examples utilizing the difference in information depth between Al K\u03b1 and Cr K\u03b1 radiation<\/li>\n<li>Frontiers of analysis examples using the latest TOF-SIMS instruments<\/li>\n<\/ul>\n<\/li><li><strong>Introduction of remote connection<\/strong><ul><li>We will demonstrate the actual remote operation and diagnostics<\/li><ul>\n<\/ul><\/ul><\/li><\/ul><\/td><\/tr>\n\n<tr><td>16:40\u3000Closing\n17:00\u3000Social Gathering<\/td><\/tr>\n <br\/><tr><td>\u203b Multiple breaks will be included during the event.<br\/>\u203b The schedule is subject to change depending on the progress of the event.<\/td><\/tr><br\/> <\/tbody><\/table><\/figure>\n","protected":false},"featured_media":810,"template":"","events-technique":[],"events-category":[28],"class_list":["post-873","events","type-events","status-publish","has-post-thumbnail","hentry","events-category-users-meeting"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.9 - aioseo.com -->\n\t<meta name=\"description\" content=\"This event is open to users of our surface analysis instruments (XPS, AES, SIMS). 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Event Overview Date and Time: February 7, 2025 (Friday), 13:00\u201317:00 (Registration opens at\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<link rel=\"canonical\" href=\"https:\/\/www.ulvac-phi.com\/en\/events\/um\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.9\" \/>\n\t\t<meta property=\"og:locale\" content=\"en_US\" \/>\n\t\t<meta property=\"og:site_name\" content=\"ULVAC PHI\u3000\u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e - \u8868\u9762\u5206\u6790\u88c5\u7f6e\uff08XPS\u30fbAES\u30fbTOF-SIMS\uff09\u30e1\u30fc\u30ab\u30fc\" \/>\n\t\t<meta property=\"og:type\" content=\"article\" \/>\n\t\t<meta property=\"og:title\" content=\"ULVAC-PHI Users Meeting - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e\" \/>\n\t\t<meta property=\"og:description\" content=\"This event is open to users of our surface analysis instruments (XPS, AES, SIMS). 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