{"id":858,"date":"2026-06-19T13:57:53","date_gmt":"2026-06-19T04:57:53","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/events\/4thkossa\/"},"modified":"2026-07-13T17:57:20","modified_gmt":"2026-07-13T08:57:20","slug":"4thkossa","status":"publish","type":"events","link":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/","title":{"rendered":"The 4th KoSSA (The Korea Society of Surface Analysis)"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">Schedule and Venue<\/h2>\n\n<p class=\"wp-block-paragraph\"><strong>Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025<br\/>Venue: KW Convention Center (Daejeon, South Korea)<\/strong><\/p>\n\n<p class=\"wp-block-paragraph\"><strong>Official website\uff1a<\/strong><strong><a href=\"https:\/\/www.surfaceanalysis.kr\/html\/\" target=\"_blank\" rel=\"noreferrer noopener\">The 4th KoSSA<\/a><\/strong><\/p>\n\n<p class=\"wp-block-paragraph\">We will be presenting the following from our company.<\/p>\n\n<p class=\"wp-block-paragraph\">Dr. Gabriele Di Stadio <br\/><strong> \u201d<\/strong><strong><em>Advanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS<\/em><\/strong><strong>\u201d<\/strong><\/p>\n","protected":false},"featured_media":807,"template":"","events-technique":[],"events-category":[29],"class_list":["post-858","events","type-events","status-publish","has-post-thumbnail","hentry","events-category-technical-symposium"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.9 - aioseo.com -->\n\t<meta name=\"description\" content=\"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<link rel=\"canonical\" href=\"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.9\" \/>\n\t\t<meta property=\"og:locale\" content=\"en_US\" \/>\n\t\t<meta property=\"og:site_name\" content=\"ULVAC PHI\u3000\u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e - \u8868\u9762\u5206\u6790\u88c5\u7f6e\uff08XPS\u30fbAES\u30fbTOF-SIMS\uff09\u30e1\u30fc\u30ab\u30fc\" \/>\n\t\t<meta property=\"og:type\" content=\"article\" \/>\n\t\t<meta property=\"og:title\" content=\"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e\" \/>\n\t\t<meta property=\"og:description\" content=\"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d\" \/>\n\t\t<meta property=\"og:url\" content=\"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/\" \/>\n\t\t<meta property=\"article:published_time\" content=\"2026-06-19T04:57:53+00:00\" \/>\n\t\t<meta property=\"article:modified_time\" content=\"2026-07-13T08:57:20+00:00\" \/>\n\t\t<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n\t\t<meta name=\"twitter:title\" content=\"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e\" \/>\n\t\t<meta name=\"twitter:description\" content=\"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d\" \/>\n\t\t<script type=\"application\/ld+json\" class=\"aioseo-schema\">\n\t\t\t{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#breadcrumblist\",\"itemListElement\":[{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#listItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/#listItem\",\"name\":\"\\u30a4\\u30d9\\u30f3\\u30c8\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/#listItem\",\"position\":2,\"name\":\"\\u30a4\\u30d9\\u30f3\\u30c8\",\"item\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events-category\\\/technical-symposium\\\/#listItem\",\"name\":\"Technical Symposium\"},\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#listItem\",\"name\":\"Home\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events-category\\\/technical-symposium\\\/#listItem\",\"position\":3,\"name\":\"Technical Symposium\",\"item\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events-category\\\/technical-symposium\\\/\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#listItem\",\"name\":\"The 4th KoSSA (The Korea Society of Surface Analysis)\"},\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/#listItem\",\"name\":\"\\u30a4\\u30d9\\u30f3\\u30c8\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#listItem\",\"position\":4,\"name\":\"The 4th KoSSA (The Korea Society of Surface Analysis)\",\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events-category\\\/technical-symposium\\\/#listItem\",\"name\":\"Technical Symposium\"}}]},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#organization\",\"name\":\"ULVAC PHI\\u3000\\u30a2\\u30eb\\u30d0\\u30c3\\u30af\\u30fb\\u30d5\\u30a1\\u30a4\\u682a\\u5f0f\\u4f1a\\u793e\",\"description\":\"\\u8868\\u9762\\u5206\\u6790\\u88c5\\u7f6e\\uff08XPS\\u30fbAES\\u30fbTOF-SIMS\\uff09\\u30e1\\u30fc\\u30ab\\u30fc\",\"url\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#webpage\",\"url\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/\",\"name\":\"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \\u30a2\\u30eb\\u30d0\\u30c3\\u30af\\u30fb\\u30d5\\u30a1\\u30a4\\u682a\\u5f0f\\u4f1a\\u793e\",\"description\":\"Schedule and Venue Date and Time: November 5 (Wednesday) \\u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \\u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\\u201d\",\"inLanguage\":\"en-US\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#website\"},\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#breadcrumblist\"},\"image\":{\"@type\":\"ImageObject\",\"url\":\"https:\\\/\\\/www.ulvac-phi.com\\\/wp-content\\\/uploads\\\/2026\\\/06\\\/16608e62c74af44ffcc5460680a49cc5_f1126.png\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#mainImage\",\"width\":130,\"height\":130},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/events\\\/4thkossa\\\/#mainImage\"},\"datePublished\":\"2026-06-19T13:57:53+09:00\",\"dateModified\":\"2026-07-13T17:57:20+09:00\"},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#website\",\"url\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/\",\"name\":\"ULVAC PHI\\u3000\\u30a2\\u30eb\\u30d0\\u30c3\\u30af\\u30fb\\u30d5\\u30a1\\u30a4\\u682a\\u5f0f\\u4f1a\\u793e\",\"description\":\"\\u8868\\u9762\\u5206\\u6790\\u88c5\\u7f6e\\uff08XPS\\u30fbAES\\u30fbTOF-SIMS\\uff09\\u30e1\\u30fc\\u30ab\\u30fc\",\"inLanguage\":\"en-US\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.ulvac-phi.com\\\/en\\\/#organization\"}}]}\n\t\t<\/script>\n\t\t<!-- All in One SEO -->\n\n","aioseo_head_json":{"title":"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","description":"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d","canonical_url":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/","robots":"max-image-preview:large","keywords":"","webmasterTools":{"miscellaneous":""},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"BreadcrumbList","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#breadcrumblist","itemListElement":[{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/#listItem","position":1,"name":"Home","item":"https:\/\/www.ulvac-phi.com\/en\/","nextItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/#listItem","name":"\u30a4\u30d9\u30f3\u30c8"}},{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/#listItem","position":2,"name":"\u30a4\u30d9\u30f3\u30c8","item":"https:\/\/www.ulvac-phi.com\/en\/events\/","nextItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/#listItem","name":"Technical Symposium"},"previousItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/#listItem","name":"Home"}},{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/#listItem","position":3,"name":"Technical Symposium","item":"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/","nextItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#listItem","name":"The 4th KoSSA (The Korea Society of Surface Analysis)"},"previousItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/#listItem","name":"\u30a4\u30d9\u30f3\u30c8"}},{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#listItem","position":4,"name":"The 4th KoSSA (The Korea Society of Surface Analysis)","previousItem":{"@type":"ListItem","@id":"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/#listItem","name":"Technical Symposium"}}]},{"@type":"Organization","@id":"https:\/\/www.ulvac-phi.com\/en\/#organization","name":"ULVAC PHI\u3000\u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","description":"\u8868\u9762\u5206\u6790\u88c5\u7f6e\uff08XPS\u30fbAES\u30fbTOF-SIMS\uff09\u30e1\u30fc\u30ab\u30fc","url":"https:\/\/www.ulvac-phi.com\/en\/"},{"@type":"WebPage","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#webpage","url":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/","name":"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","description":"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d","inLanguage":"en-US","isPartOf":{"@id":"https:\/\/www.ulvac-phi.com\/en\/#website"},"breadcrumb":{"@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#breadcrumblist"},"image":{"@type":"ImageObject","url":"https:\/\/www.ulvac-phi.com\/wp-content\/uploads\/2026\/06\/16608e62c74af44ffcc5460680a49cc5_f1126.png","@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#mainImage","width":130,"height":130},"primaryImageOfPage":{"@id":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/#mainImage"},"datePublished":"2026-06-19T13:57:53+09:00","dateModified":"2026-07-13T17:57:20+09:00"},{"@type":"WebSite","@id":"https:\/\/www.ulvac-phi.com\/en\/#website","url":"https:\/\/www.ulvac-phi.com\/en\/","name":"ULVAC PHI\u3000\u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","description":"\u8868\u9762\u5206\u6790\u88c5\u7f6e\uff08XPS\u30fbAES\u30fbTOF-SIMS\uff09\u30e1\u30fc\u30ab\u30fc","inLanguage":"en-US","publisher":{"@id":"https:\/\/www.ulvac-phi.com\/en\/#organization"}}]},"og:locale":"en_US","og:site_name":"ULVAC PHI\u3000\u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e - \u8868\u9762\u5206\u6790\u88c5\u7f6e\uff08XPS\u30fbAES\u30fbTOF-SIMS\uff09\u30e1\u30fc\u30ab\u30fc","og:type":"article","og:title":"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","og:description":"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d","og:url":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/","article:published_time":"2026-06-19T04:57:53+00:00","article:modified_time":"2026-07-13T08:57:20+00:00","twitter:card":"summary_large_image","twitter:title":"The 4th KoSSA (The Korea Society of Surface Analysis) - ULVAC PHI \u30a2\u30eb\u30d0\u30c3\u30af\u30fb\u30d5\u30a1\u30a4\u682a\u5f0f\u4f1a\u793e","twitter:description":"Schedule and Venue Date and Time: November 5 (Wednesday) \u2013 7 (Friday), 2025Venue: KW Convention Center (Daejeon, South Korea) Official website\uff1aThe 4th KoSSA We will be presenting the following from our company. Dr. Gabriele Di Stadio \u201dAdvanced Surface and Interface Characterization for Semiconductor Devices Using XPS and TOF-SIMS\u201d"},"aioseo_meta_data":{"post_id":"858","title":null,"description":null,"keywords":null,"keyphrases":null,"primary_term":null,"canonical_url":null,"og_title":null,"og_description":null,"og_object_type":"default","og_image_type":"default","og_image_custom_url":null,"og_image_custom_fields":null,"og_image_url":null,"og_image_width":null,"og_image_height":null,"og_video":null,"og_custom_url":null,"og_article_section":null,"og_article_tags":null,"twitter_use_og":false,"twitter_card":"default","twitter_image_type":"default","twitter_image_custom_url":null,"twitter_image_custom_fields":null,"twitter_image_url":null,"twitter_title":null,"twitter_description":null,"schema_type":"default","schema_type_options":null,"schema":{"blockGraphs":[],"customGraphs":[],"default":{"data":{"Article":[],"Course":[],"Dataset":[],"FAQPage":[],"Movie":[],"Person":[],"Product":[],"ProductReview":[],"Car":[],"Recipe":[],"Service":[],"SoftwareApplication":[],"WebPage":[]},"graphName":"","isEnabled":true},"graphs":[]},"pillar_content":false,"robots_default":true,"robots_noindex":false,"robots_noarchive":false,"robots_nosnippet":false,"robots_nofollow":false,"robots_noimageindex":false,"robots_noodp":false,"robots_notranslate":false,"robots_max_snippet":null,"robots_max_videopreview":null,"robots_max_imagepreview":"large","priority":null,"frequency":null,"local_seo":null,"limit_modified_date":false,"ai":null,"breadcrumb_settings":null,"seo_analyzer_scan_date":null,"created":"2026-07-13 08:57:20","updated":"2026-07-13 09:18:42"},"aioseo_breadcrumb":"<div class=\"aioseo-breadcrumbs\"><span class=\"aioseo-breadcrumb\">\n\t\t\t<a href=\"https:\/\/www.ulvac-phi.com\/en\/\" title=\"Home\">Home<\/a>\n\t\t<\/span><span class=\"aioseo-breadcrumb-separator\">&raquo;<\/span><span class=\"aioseo-breadcrumb\">\n\t\t\t<a href=\"https:\/\/www.ulvac-phi.com\/en\/events\/\" title=\"\u30a4\u30d9\u30f3\u30c8\">\u30a4\u30d9\u30f3\u30c8<\/a>\n\t\t<\/span><span class=\"aioseo-breadcrumb-separator\">&raquo;<\/span><span class=\"aioseo-breadcrumb\">\n\t\t\t<a href=\"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/\" title=\"Technical Symposium\">Technical Symposium<\/a>\n\t\t<\/span><span class=\"aioseo-breadcrumb-separator\">&raquo;<\/span><span class=\"aioseo-breadcrumb\">\n\t\t\tThe 4th KoSSA (The Korea Society of Surface Analysis)\n\t\t<\/span><\/div>","aioseo_breadcrumb_json":[{"label":"Home","link":"https:\/\/www.ulvac-phi.com\/en\/"},{"label":"\u30a4\u30d9\u30f3\u30c8","link":"https:\/\/www.ulvac-phi.com\/en\/events\/"},{"label":"Technical Symposium","link":"https:\/\/www.ulvac-phi.com\/en\/events-category\/technical-symposium\/"},{"label":"The 4th KoSSA (The Korea Society of Surface Analysis)","link":"https:\/\/www.ulvac-phi.com\/en\/events\/4thkossa\/"}],"_links":{"self":[{"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/events\/858","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/events"}],"about":[{"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/types\/events"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/media\/807"}],"wp:attachment":[{"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/media?parent=858"}],"wp:term":[{"taxonomy":"events-technique","embeddable":true,"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/events-technique?post=858"},{"taxonomy":"events-category","embeddable":true,"href":"https:\/\/www.ulvac-phi.com\/en\/wp-json\/wp\/v2\/events-category?post=858"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}