{"id":847,"date":"2026-06-19T15:26:09","date_gmt":"2026-06-19T06:26:09","guid":{"rendered":"https:\/\/www.ulvac-phi.com\/events\/upshow2024\/"},"modified":"2026-07-13T17:25:14","modified_gmt":"2026-07-13T08:25:14","slug":"upshow2024","status":"publish","type":"events","link":"https:\/\/www.ulvac-phi.com\/en\/events\/upshow2024\/","title":{"rendered":"ULVAC-PHI Technical Symposium"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">We are pleased to announce that our well-received Technical Symposium will be held again this year.<br\/>We look forward to welcoming you.<\/p>\n\n<h2 class=\"wp-block-heading\">Event Overview<\/h2>\n\n<p class=\"wp-block-paragraph\"><strong>Date and Time: July 12, 2024 (Friday), 13:00\u201317:00 (Registration opens at 12:30)<br\/>Venue: Mita NN Hall (Tokyo)<\/strong><\/p>\n\n<p class=\"wp-block-paragraph\">&#8211; <a href=\"https:\/\/mita-nn-hall.com\/access\" target=\"_blank\" rel=\"noreferrer noopener\">Mita NN Hall Access<\/a><\/p>\n\n<h2 class=\"wp-block-heading\">Program<\/h2>\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><tbody><tr><td class=\"has-text-align-left\" data-align=\"left\">13:00\u3000Opening<br\/>Shinichi Iida, Product Strategy Department, ULVAC-PHI, Inc.<br\/>&#8220;<strong>Automated Measurement in TOF-SIMS: Toward Efficient Data Collection<\/strong>&#8220;<br\/>\u3000\u3000\u3000\u3000ULVAC-PHI, Inc., Masahiro Terashima<br\/>&#8220;<strong>Evaluation of Semiconductor Materials Using PHI GENESIS<\/strong>&#8220;<br\/>\u3000\u3000\u30fc Break \u30fc<br\/>14:20\u3000Mr. Kenji Nagata, Center for Basic Research on Materials, National Institute for Materials Science (NIMS)<br\/>&#8220;Spectral Analysis Enabled by Bayesian Estimation and Its Application to XPS Measurement&#8221;<br\/>15:05\u3000Mr. Junichiro Sameshima, General Manager, Surface Science Research Department, Toray Research Center, Inc.<br\/>\u3000 &#8220;Application Examples of Surface Analysis Methods in Industry&#8221;<br\/>\u3000\u3000\u2015 Break \u2015<br\/>16:15\u3000Prof. Akinobu Teramoto, Director, Research Institute for Semiconductor Technology, Hiroshima University<br\/>&#8220;Surface and Interface Analysis of Thin Films in Semiconductor Devices&#8221;<br\/>17:00\u3000Closing<br\/>\u3000\u3000\u3000\u3000Social Gathering<br\/>\u203b The schedule is subject to change depending on the progress of the event.<\/td><\/tr><\/tbody><\/table><\/figure>\n\n<h3 class=\"wp-block-heading\">Notices and Precautions<\/h3>\n\n<ul class=\"wp-block-list\">\n<li>Participation is free of charge.<\/li>\n\n\n\n<li>Participation is limited to our customers.<\/li>\n\n\n\n<li>Registration will close once capacity is reached.<\/li>\n\n\n\n<li>The program is subject to change without notice.<\/li>\n\n\n\n<li>The program for the event will be updated on this page as information becomes available.<\/li>\n<\/ul>\n\n<h2 class=\"wp-block-heading\">Venue Information<\/h2>\n\n<h3 class=\"wp-block-heading\">Mita NN Hall <a href=\"https:\/\/mita-nn-hall.com\/access\">\u3010Access\u3011<\/a><\/h3>\n\n<p class=\"wp-block-paragraph\">B1F, Mita NN Building, 4-1-23 Shiba, Minato-ku, Tokyo<\/p>\n\n<p class=\"wp-block-paragraph\">5-minute walk from Tamachi Station (Mita Exit \/ West Exit) on the JR Yamanote Line \/ Keihin-Tohoku Line<br\/>Direct access from Mita Station on the Toei Mita Line (Exit A9) \/ 3-minute walk from Mita Station on the Toei Asakusa Line<\/p>\n","protected":false},"featured_media":810,"template":"","events-technique":[],"events-category":[29],"class_list":["post-847","events","type-events","status-publish","has-post-thumbnail","hentry","events-category-technical-symposium"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.9 - aioseo.com -->\n\t<meta name=\"description\" content=\"We are pleased to announce that our well-received Technical Symposium will be held again this year.We look forward to welcoming you. 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