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Our Products

Surface Analysis Instrument

AES PHI 700Xi ™ Scanning Auger Nanoprobe

ESCA / XPS PHI Quantera SXM ™ Scanning X-ray Microprobe ™ PHI 5000 VersaProbe ™ Scanning X-ray Microprobe ™

TOF-SIMS PHI TRIFT V nanoTOF ™ Secondary Ion Mass Spectrometry

D-SIMS PHI ADEPT-1010 ™ Automated Depth Profiling Tool/ Quadrupole SIMS