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Surface Analysis Instruments
AES
PHI 700Xi ™ Scanning Auger Nanoprobe
ESCA / XPS
PHI Quantera
II ™ Scanning XPS Microprobe ™
PHI 5000 VersaProbe
II Scanning XPS Microprobe ™
TOF-SIMS
PHI TRIFT V
nanoTOF
™ Secondary Ion Mass Spectrometry
D-SIMS
PHI ADEPT-1010 ™ Automated Depth Profiling Tool/ Quadrupole SIMS