Events
Surface Analysis Technique Seminar & ULVAC-PHI's Users Meeting in Singapore
| Date | 1:00 PM to 5:30 PM, 9th of December 2011, |
| Place | Furama City Centre (60 Eu Tong Sen Street, Singapore) |
| Cost | Free of charge |
| Time | 1:00-1:30  Registration and Opening1:30-3:15 Seminar Talk I (For abstract)3:15-3:35 Coffee Break3:35-4:00 Seminar Talk II4:00-4:50 User's Meeting including customer's talk4:50-5:15 Instrumental introduction by ULVAC-PHI5:15-5:30 Discussion and Closing |
| Seminar Topic |
TOF-SIMS Imaging and Depth Profile Characterization of Plant Epicuticular Waxes and Treated Mouse Skin John S. Hammond, Physical Electronics, Inc. Recent Applications of GCIB Depth Profiling with XPS and TOF-SIMS Takuya Miyayama, ULVAC-PHI, Inc. AUGER SURFACE ANALYSIS OF DEPOSITS FORMED ON MAGNETIC TAPE RECORDING HEAD SURFACE John S. Hammond, Physical Electronics, Inc |
| Customer's talk |
Applications of Auger Technique in Silicon IC Manufacturing Industry Hua Younan, Ph.D, Director/ QRA-Failure Analysis. GLOBALFOUNDRIES Singapore Pte, Ltd. |
| Contact | ULVAC-PHI,INC. Overseas Sales TEL:+81-467-4220 or Webform |
